Scanning JEOL
JEOL 6400 scanning electron microscope. Backscatter detector and THERMO NORAN EDS detector for element analysis. Filament: Wolfram.
JEOL
Last updated 23.2.2011
- Scanning electron microscope
JEOL 6400 scanning electron microscope. Backscatter detector and THERMO NORAN EDS detector for element analysis. Filament: Wolfram.
JEOL
Last updated 23.2.2011