Scanning ZEISS

ZEISS Supra 55VP scanning electron microscope. Field emission. KV range: 100 V til 30 kV. Magnification up to 1,5 million times. STEM detector, EDS detector for element analysis, WDS detector for element analysis, backscatter detector, cathode luminiscense detector. Variable pressure detector.

ZEISS

ZEISS Supra 55VP scanning electron microscope. Foto: Irene Heggstad.